Abstract
WE have investigated the influence of temperature on the intensity (IT) maxima due to the diffraction of slow electrons from a cleavage plane of Ceylon graphite, using the method of constant Bragg angle (θ = 65°). The apparatus used in these experiments is described in detail elsewhere1.
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W. E. Laschkarew, E. W. Bärengarten, and G. A. Kuzmin, Z. Phys., 85, 631; 1933.
I. Bakhurst, Proc. Roy. Soc., A, 102, 340; 1923.
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LASCHKAREW, W., KUZMIN, G. Effect of Temperature on Diffraction of Slow Electrons and its Application. Nature 134, 62 (1934). https://doi.org/10.1038/134062a0
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DOI: https://doi.org/10.1038/134062a0
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