Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.
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Burresi, M. Device-level photonic testing. Nature Photon 9, 8–9 (2015). https://doi.org/10.1038/nphoton.2014.313
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DOI: https://doi.org/10.1038/nphoton.2014.313