Related collection at the Journal of Applied Crystallography
CCP-FEL: a collection of computer programs for free-electron laser research |
Table of contents (view at J. Appl. Cryst.)
WavePropaGator: interactive framework for X-ray free-electron laser optics design and simulations
Samoylova, L., Buzmakov, A., Chubar, O. & Sinn, H. J. Appl. Cryst. 49, 1347-1355 (2016).
XMDYN and XATOM: versatile simulation tools for quantitative modeling of X-ray free-electron laser induced dynamics of matter
Jurek, Z., Son, S.-K., Ziaja, B. & Santra, R. J. Appl. Cryst. 49, 1048-1056 (2016).
Condor: a simulation tool for flash X-ray imaging
Hantke, M. F., Ekeberg, T. & Maia, F. R. N. C. J. Appl. Cryst. 49, 1356-1362 (2016).
Hummingbird: monitoring and analyzing flash X-ray imaging experiments in real time
Daurer, B. J., Hantke, M. F., Nettelblad, C. & Maia, F. R. N. C. J. Appl. Cryst. 49, 1042-1047 (2016).
OnDA: online data analysis and feedback for serial X-ray imaging
Mariani, V. et al. J. Appl. Cryst. 49, 1073-1080 (2016).
CFEL-ASG Software Suite (CASS): usage for free-electron laser experiments with biological focus
Foucar, L. J. Appl. Cryst. 49, 1336-1346 (2016).
Data processing pipeline for serial femtosecond crystallography at SACLA
Nakane, T. et al. J. Appl. Cryst. 49, 1035-1041 (2016).
Linac Coherent Light Source data analysis using psana
Damiani, D. et al. J. Appl. Cryst. 49, 672-679 (2016).
Data systems for the Linac Coherent Light Source
Thayer, J. et al. J. Appl. Cryst. 49, 1363-1369 (2016).
Dragonfly: an implementation of the expand-maximize-compress algorithm for single-particle imaging
Ayyer, K., Lan, T.-Y., Elser, V. & Loh, N. D. J. Appl. Cryst. 49, 1320-1335 (2016).
Facilitating model reconstruction for single-particle scattering using small-angle X-ray scattering methods
Ma, S. & Liu, H. J. Appl. Cryst. 49, 665-671 (2016).
On the release of cppxfel for processing X-ray free-electron laser images
Ginn, H. M., Evans, G., Sauter, N. K. & Stuart, D. I. J. Appl. Cryst. 49, 1065-1072 (2016).
Recent developments in CrystFEL
White, T. A. et al. J. Appl. Cryst. 49, 680-689 (2016).
Identification of rogue datasets in serial crystallography
Assmann, G., Brehm, W. & Diederichs, K. J. Appl. Cryst. 49, 1021-1028 (2016).
Modeling truncated pixel values of faint reflections in MicroED images
Hattne, J., Shi, D., de la Cruz, M. J., Reyes, F. E. & Gonen, T. J. Appl. Cryst. 49, 1029-1034 (2016).
IOTA: integration optimization, triage and analysis tool for the processing of XFEL diffraction images.
Lyubimov, A. Y. et al. J. Appl. Cryst. 49, 1057-1064 (2016).