Abstract
THE study of chemical phase separation in multicomponent thin organic films typically involves the addition of a dye which is selectively more soluble in one of the phases, thereby making it possible to probe the domain structures by fluorescence microscopy1–4. The resolution of this approach is generally limited to tens of micrometres. The atomic force microscope, on the other hand, has recently proved useful for imaging organic thin films down to the atomic scale5–9, but this technique provides details of the overall film topography, rather than the chemical composition. Here we show that the recently developed friction force microscope10–13, which simultaneously measures both the normal and lateral forces on the scanning tip, can be used to image and identify compositional domains with a resolution of ∼5 Å. Although the topography of the individual domains can be imaged with a standard atomic force microscope, it is the additional information provided by the friction measurement that allows them to be chemically differentiated.
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References
Knobler, C. J. Phys.: Condens. Matter 3, S17–S22 (1991).
Möbius, D. & Möhald, H. Adv. Mater. 3, 19–24 (1991).
Seul, M. & Sammon, M. J. Phys. Rev. Lett. 64, 1903–1906 (1990).
Chi, L. F., Johnston, R. R. & Ringsdorf, H. Langmuir 7, 2323–2329 (1991).
Binnig, G., Quate, C. F. & Gerber, C. Phys. Rev. Lett. 56, 930–933 (1986).
Meyer, E. et al. Nature 349, 398–400 (1991).
Bourdieu, L., Silberzan, P. & Chatenay, D. Phys. Rev. Lett. 67, 2029–2031 (1991).
Alves, C., Smith, E. & Porter, M. J. Am. chem. Soc. 114, 1222–1227 (1992).
Frommer, J. Angew. Chem. 31 (in the press).
Mate, C. M., McClelland, G. M., Erlandsson, R. & Chiang, S. Phys. Rev. Lett. 59, 1942–1945 (1987).
Meyer, G. & Amer, N. M. Appl. Phys. Lett. 57, 2089–2091 (1990).
Marti, O., Colchero, J. & Mlynek, J. Nanotechnology 1, 141–144 (1990).
Erlandsson, R. et al. J. Chem. Phys. 89, 5190–5193 (1988).
Binnig, G., Rohrer, H., Gerber, C. & Weibel, E. Appl. Phys. Lett. 40, 178–181 (1982).
Binnig, G. et al. Europhys. Lett. 3, 1281–1286 (1987).
Meyer, E. et al. J. Vac. Sci. Technol. B2, 1329–1332 (1991).
Feenstra, R. M., Stroscio, J. A., Tersoff, J. & Fein, A. P. Phys. Rev. Lett. 58, 1192–1195 (1987).
Hamers, R. J., Avouris, Ph. & Bozso, F. J. Vac. Sci. Technol. A6, 508–511 (1988).
Behm, R. J. Scanning Tunneling Microscopy and Related Methods (eds Behm, R. J., Garcia, N. & Rohrer, H.) 173–209 (NATO ASI Series, 1990).
Feenstra, R. M. Scanning Tunneling Microscopy and Related Methods (eds Behm, R. J., Garcia, N. & Rohrer, H.) 211–240 (NATO ASI Series, 1990).
Bowden, F. P. & Tabor, D. The Friction and Wear of Solids (Oxford Univ. Press, London, 1950).
Israelachvili, J. N. & Tabor, D. Wear 24, 386–390 (1973).
Briscoe, B. J. & Evans, D. C. B. Proc. R. Soc. A380, 389–407 (1982).
Murray, R. W. Electroanalytical Chemistry, Vol. 13 (ed. Bard, A. J.) 191–368 (Dekker, Marcel, New York, 1984).
Fujihira, M. Topics in Organic Electrochemistry (eds Fry, A. J. & Britton, W. E.) 255–294 (Plenum, New York, 1986).
Ullman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly (Academic, New York, 1991).
Naselli, C., Swalen, J. D. & Rabolt, J. F. J. chem. Phys. 90, 3855–3860 (1989).
Briscoe, B. & Tabor, D. Interfacial Phenomena in Apolar Media (eds Eicke, H.-F. & Parfitt, G. D.) 327–356 (Dekker, Marcel, New York, 1987).
Meyer, E. et al. Fundamentals of Friction (eds Pollock, M. & Singer, I.) (Kluwer, in the press).
Meyer, E. et al. Ultramicroscopy (in the press).
Barton, S. W. et al. J. chem. Phys. 96, 1343–1351 (1992).
Hardy, W. B. Proc. R. Soc. A88, 313–315 (1913).
Rabinowitz, E. & Tabor, D. Proc. R. Soc. A208, 455–474 (1951).
Hsu, S. L. et al. Macromolecules 23, 4565 (1990).
Bates, T. W. & Stockmayer, W. H. Macromolecules 1, 12 (1968).
Meyer, E. et al. Thin Solid Films (in the press).
Umemura, J. et al. Thin Solid Films 178, 281 (1989).
Nishiyama, K., Kurihara, M. & Fujihira, M. Thin Solid Films 179, 477 (1989).
Schreck, M. et al. Thin Solid Films 175, 95–105 (1989).
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Overney, R., Meyer, E., Frommer, J. et al. Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature 359, 133–135 (1992). https://doi.org/10.1038/359133a0
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DOI: https://doi.org/10.1038/359133a0
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