Fig. 2: Experimental characterization of the correlation between artifacts and abnormal features of reconstructed spectrum.
From: High-fidelity structured illumination microscopy by point-spread-function engineering
a SR images of 100 nm fluorescent microspheres collected from our home-built TIRF-SIM setup were reconstructed using the traditional Wiener-SIM we implemented, fairSIM, and HiFi-SIM, and the corresponding reconstructed spectrum is shown on the right. Note that the reconstructed spectrum of traditional Wiener-SIM and fairSIM both show obvious patchy features, and the real microspheres in the SR images contain obvious sidelobe artifacts. b Magnified images of the red-box region in a, and the line profiles along the microspheres in b show diminishing sidelobe artifacts in HiFi-SIM. c Full-width half-maxima (FWHMs) of the fluorescence profiles of 10 microspheres in the reconstruction images of traditional Wiener-SIM, fairSIM, and HiFi-SIM
