Fig. 3: Quantitative characterization of the fidelity of HiFi-SIM reconstruction.
From: High-fidelity structured illumination microscopy by point-spread-function engineering
a “Start” patterns in Argolight slide were imaged by DeltaVision OMX with 5 ms exposure. The equivalent wide-field image is shown in the upper-left, and the SR images of fairSIM and HiFi-SIM are presented in the upper-right and lower-right corners, respectively. b Magnified SR images reconstructed from the magenta-box region in a using GE SoftWoRx, fairSIM, and HiFi-SIM. The ground-truth (GT) is shown on left, which is reconstructed by HiFi-SIM from the same region of high-quality data with 50 ms exposure. Intensity profiles along the magenta line in b confirm that HiFi-SIM eliminates almost all sidelobe artifacts around the real lines. c Error-map of the SIM images to the ground-truth model. RMSE and SSIM values are shown in the lower-left corner. d, e Comparison of the SR images for “ring” patterns in Argolight slide with 10 ms exposure time, reconstructed by fairSIM, HiFi-SIM, and SoftWoRx. f SSIM plot of reconstructed SR results vs. the ground-truth model, with different reconstruction parameters
