Fig. 7
From: Stateful characterization of resistive switching TiO2 with electron beam induced currents
Experimental fit of beam energy dependence. Measured electron yield as a function of energy. Error bars indicate two standard deviations of the mean within an 11 × 11 pixel box at the signal center for the on-state and off-state micrograph series in Fig. 5. All quantities are measured with respect to the background. Fits are shown with least-squares 95% confidence intervals with units of keV−1 (*note δ is dimensionless). Only the least-squares coefficient for the internal secondary electron emission (ISEE) signal, a, with associated variables aon and aoff changes between the off state and the on state
