Fig. 4

Non contributing zone a Experimental EQE for devices exposed to ambient for 60 (dash) and 15 (solid) minutes illuminated through the anode (blue) and cathode (red), and the active layer absorption (black). b TMM simulated EQE for devices with 0% IQE on the anode half and 55% IQE on the cathode half (solid), 0% IQE in 1/3 of the device close to the anode and 75% IQE in the cathode side (dash) and experimental EQE from panel a (gray). c Illustration of the position of the areas with different IQE used in b. The active layer is divided in working (green) and dead (red) areas. d Schematic illustration of the (1—EQE ratio) calculation. A part of the active layer with thickness d₁ and 0% IQE on the anode side reduces the illumination intensity incident upon the working part by transmission through the dead layer, T₁. e 1—EQE ratio for a device cast under inert conditions (red), a device exposed to ambient (blue) and the scaled absorption coefficient of the AL (black)