Extended Data Fig. 6: Measured penetration field capacitance for devices A1, C1 and S1 at 18 T.
From: Spin–orbit-driven band inversion in bilayer graphene by the van der Waals proximity effect
a–c, CP measured as a function of D and n at B = 18 T for devices C1 (a), A1 (b) and S1 (c). The red dashed line in c shows the location of the linecut plotted in Extended Data Fig. 7a.
