Table 1 Sample characteristics (film thickness (tN), substrate, growth temperature (Tg), resistivity (ρ)), input charge current density (jc) and observed transverse spin polarization (P−cosϕ)
From: Current-induced spin polarization on metal surfaces probed by spin-polarized positron beam
Sample | tN (nm) | Substrate | Tg (°C) | ρ (µΩcm) | jc (A/cm2) | P−cosϕ (%) |
|---|---|---|---|---|---|---|
Au(001) | 25 | Fe(001)/MgO(001) | 27 | 16 | 2.4 × 105 | Null |
Cu | 25 | MgO(001) | 27 | 8 | 2.4 × 105 | Null |
Pt(111) | 25 | Al2O3(0001) | 600 | 21 | 2.0 × 105 | 11 ± 2 |
Pd(111) | 25 | Al2O3(0001) | 500 | 27 | 2.4 × 105 | 8 ± 2 |
α-Ta | 10 | Al2O3(0001) | 600 | 43 | 2.5 × 105 | −12 ± 3 |
β-Ta | 10 | SiO2/Si(001) | 27 | 128 | 5.0 × 104 | −7 ± 2 |
α-W | 10 | Al2O3(0001) | 600 | 28 | 1.0 × 105 | −6 ± 2 |
βα-W | 10 | SiO2/Si(001) | 27 | 110 | 1.0 × 105 | −9 ± 3 |
