Abstract
IN X-ray fluorescence analysis, the limit of detection of an element is usually set by statistical fluctuations in the continuous background at the wave-length of the most ‘sensitive’ line of the element. Consequently, the sensitivity of detection of an element will be improved if the intensity of the continuum is decreased. A typical example is the use of pulse height analysis with a detector the output pulse height of which is proportional to the energy of the incident quantum. By this means, overlapping orders of background can be rejected, resulting in increased sensitivity.
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Evans, R. D., Handbuch Phys., 34, 229 (Springer-Verlag, Berlin, 1958).
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CHAMPION, K., WHITTEM, R. Utilization of Increased Sensitivity of X-ray Fluorescence Spectrometry due to Polarization of the Background Radiation. Nature 199, 1082 (1963). https://doi.org/10.1038/1991082a0
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DOI: https://doi.org/10.1038/1991082a0
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